Analytical services are available including on site client's observation.
Major analytical tools include HR-TEM, Q-pole type SIMS, micro-ESCA and RAMAN. Expertise and know-hows exist in micro and nano level surface analysis that will provide the most reliable data with short period of time. Technical advice and consulting on unknown materials is also available.
Service
Analytical services
Analysis is conducted with the sample provided by a client and the analysis report is delivered. Appropriate analysis approaches will be proposed on request.
On site Observation Analysis
Client's observation on site analysis is available. Client can confirm the analysis conditions, procedures and the results on site.
Equipment
Surface Analysis Micro-Region Morphology ObservationNano Indentation
Atomic Force Microscopy (AFM)
X-Ray Diffraction (XRD)
Field of Interest
Information to acquire
| Field of Interest | Equipment | Information to Acquire |
|---|---|---|
| Semiconductor Thin Film Device Sample for Ion Implantation |
HR-TEM | Atomic level morphology observation, Crystalline structure, Dislocation density, Film thickness |
| HR-SEM | Surface structure, Cross sectional structure (Film thickness) | |
| XRD | Crystallinity (Plane direction), Multilayer periodic structure | |
| XPS/ESCA | Surface composition, Chemical state, Depth profile | |
| SIMS | Impurity concentration, Depth profile | |
| RAMAN | Chemical state, Stress strain | |
| RBS | Composition , Crystallinity | |
| Nano Indentation | Surface modulus, Hardness | |
| Functional Thin Film Surface Treatment with DLC etc Coating |
HR-TEM | Surface damage observation |
| HR-SEM | Surface morphology | |
| XPS/ESCA | Composition, Chemical state, Depth profile | |
| SIMS | Impurity concentration, Depth profile | |
| RBS/ERDA | Composition elements, Composition | |
| Material, Electronic Device Powder (Particle) Carbon Nano-Tube, Graphite Printed Circuit Board |
HR-TEM | Particle (Grain) size, Crystalline structure |
| HR-SEM | Particle (Grain) size, Surface morphology (Aggregation) | |
| XRD | Crystalline structure | |
| XPS/ESCA | Composition, Surface analysis | |
| RAMAN | Chemical state |